Journal article
Patricia M. McGuiggan, Daniel A. Grave, Jay S. Wallace, Shengfeng Cheng, Andrea Prosperetti, Mark O. Robbins
Langmuir, vol. 27(19), 2011 Aug 2, pp. 11966-11972
Langmuir, vol. 27(19), 2011 Aug 2, pp. 11966-11972
Cite
Cite
APA
McGuiggan, P. M., Grave, D. A., Wallace, J. S., Cheng, S., Prosperetti, A., & Robbins, M. O. (2011). Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM). Langmuir, 27(19), 11966–11972.
Chicago/Turabian
McGuiggan, Patricia M., Daniel A. Grave, Jay S. Wallace, Shengfeng Cheng, Andrea Prosperetti, and Mark O. Robbins. “Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM).” Langmuir 27, no. 19 (August 2, 2011): 11966–11972.
MLA
McGuiggan, Patricia M., et al. “Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM).” Langmuir, vol. 27, no. 19, Aug. 2011, pp. 11966–72.