Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM).


Journal article


Patricia M. McGuiggan, Daniel A. Grave, Jay S. Wallace, Shengfeng Cheng, Andrea Prosperetti, Mark O. Robbins
Langmuir, vol. 27(19), 2011 Aug 2, pp. 11966-11972

Cite

Cite

APA
McGuiggan, P. M., Grave, D. A., Wallace, J. S., Cheng, S., Prosperetti, A., & Robbins, M. O. (2011). Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM). Langmuir, 27(19), 11966–11972.

Chicago/Turabian
McGuiggan, Patricia M., Daniel A. Grave, Jay S. Wallace, Shengfeng Cheng, Andrea Prosperetti, and Mark O. Robbins. “Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM).” Langmuir 27, no. 19 (August 2, 2011): 11966–11972.

MLA
McGuiggan, Patricia M., et al. “Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM).” Langmuir, vol. 27, no. 19, Aug. 2011, pp. 11966–72.


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