Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM).


Journal article


Patricia M. McGuiggan, Daniel A. Grave, Jay S. Wallace, Shengfeng Cheng, Andrea Prosperetti, Mark O. Robbins
Langmuir, vol. 27(19), 2011 Aug 2, pp. 11966-11972

Cite

Cite

APA   Click to copy
McGuiggan, P. M., Grave, D. A., Wallace, J. S., Cheng, S., Prosperetti, A., & Robbins, M. O. (2011). Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM). Langmuir, 27(19), 11966–11972.


Chicago/Turabian   Click to copy
McGuiggan, Patricia M., Daniel A. Grave, Jay S. Wallace, Shengfeng Cheng, Andrea Prosperetti, and Mark O. Robbins. “Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM).” Langmuir 27, no. 19 (August 2, 2011): 11966–11972.


MLA   Click to copy
McGuiggan, Patricia M., et al. “Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM).” Langmuir, vol. 27, no. 19, Aug. 2011, pp. 11966–72.


BibTeX   Click to copy

@article{patricia2011a,
  title = {Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM).},
  year = {2011},
  month = aug,
  day = {2},
  issue = {19},
  journal = {Langmuir},
  pages = {11966-11972},
  volume = {27},
  author = {McGuiggan, Patricia M. and Grave, Daniel A. and Wallace, Jay S. and Cheng, Shengfeng and Prosperetti, Andrea and Robbins, Mark O.},
  month_numeric = {8}
}


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